State of the art in testing components

Authors: 
Beydeda, Sami
Gruhn, Volker
Year: 
2003
Appeared / Erschienen in: 
Huimin Lin, Hans-Dieter Ehrich (Ed.): Proceedings of the Third International Conference on Quality Software, Dallas, Texas, USA, 06.11.2003 - 07.11.2003. IEEE Computer Society Press ISBN: 0-7695-2015-4
Pubdate / Erscheinungsdatum: 
06.11.2003
URL: 
http://ebus.informatik.uni-leipzig.de/papers/paperuploads/054_beydeda_sami.update.pdf
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