Test data generation based on binary search for class-level testing

Authors: 
Beydeda, Sami
Gruhn, Volker
Year: 
2003
Appeared / Erschienen in: 
ACS/IEEE International Conference on Computer Systems and Applications (AICCSA03), Tunis, Tunesien, 14.07.2003 - 18.07.2003
Pubdate / Erscheinungsdatum: 
14.07.2003
URL: 
http://ebus.informatik.uni-leipzig.de/papers/paperuploads/published.pdf
BibTex URL: 
http://ebus.informatik.uni-leipzig.de/www/de/publications/artikel/../../../media/publications/show_bibtex.php?submitted=1&what=1&id=85
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Beydeda2003Testdatagenerationbasedonbinarysearchforclasslevel.pdf79.57 KB